TY - GEN
T1 - TVS transient behavior characterization and SPICE based behavior model
AU - Wei, Pengyu
AU - Maghlakelidze, Giorgi
AU - Patnaik, Abhishek
AU - Gossner, Harald
AU - Pommerenke, David
PY - 2018/10/25
Y1 - 2018/10/25
N2 - A SPICE model for the transient behavior of TVS devices is presented. TVS devices under ESD stress do not turn on instantaneously and a transient overshoot can be observed at start-up. This model includes small signal RF behavior, quasi-static VI curve, inductive overshoot, conductivity modulation, snapback trigger delay and the ability to be used on any SPICE simulation.
AB - A SPICE model for the transient behavior of TVS devices is presented. TVS devices under ESD stress do not turn on instantaneously and a transient overshoot can be observed at start-up. This model includes small signal RF behavior, quasi-static VI curve, inductive overshoot, conductivity modulation, snapback trigger delay and the ability to be used on any SPICE simulation.
UR - http://www.scopus.com/inward/record.url?scp=85056881941&partnerID=8YFLogxK
M3 - Conference paper
AN - SCOPUS:85056881941
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PB - ESD Association
T2 - 40th Annual Electrical Overstress/Electrostatic Discharge Symposium
Y2 - 23 September 2018 through 28 September 2018
ER -