Transmission electron microscopy and characterization of NiFe2O4 nanoparticles dispersed in SiO2 matrix

K. Nadeem, Ilse Letofsky-Papst, Thomas Traußnig, Roland Würschum, Harald Krenn

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMaterials Science
Place of PublicationWien
PublisherFacultas
Pages103-104
ISBN (Print)978-3-85125-062-6
DOIs
Publication statusPublished - 2009
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Transmission electron microscopy and characterization of NiFe2O4 nanoparticles dispersed in SiO2 matrix. / Nadeem, K.; Letofsky-Papst, Ilse; Traußnig, Thomas; Würschum, Roland; Krenn, Harald.

Materials Science. Wien : Facultas, 2009. p. 103-104.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Nadeem, K, Letofsky-Papst, I, Traußnig, T, Würschum, R & Krenn, H 2009, Transmission electron microscopy and characterization of NiFe2O4 nanoparticles dispersed in SiO2 matrix. in Materials Science. Facultas, Wien, pp. 103-104, Multinational Congress on Microscopy, Graz, Austria, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-424
Nadeem, K. ; Letofsky-Papst, Ilse ; Traußnig, Thomas ; Würschum, Roland ; Krenn, Harald. / Transmission electron microscopy and characterization of NiFe2O4 nanoparticles dispersed in SiO2 matrix. Materials Science. Wien : Facultas, 2009. pp. 103-104
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AU - Krenn, Harald

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