Towards single atom sensitivity in the analytical TEM

Werner Grogger, Christian Gspan, Stefanie Fladischer, Gerald Kothleitner, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Microscopy Congress
Publisher.
Pages685-686
VolumeVolume:2
ISBN (Print)978-0-9502463-6-9
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sep 201221 Sep 2012

Publication series

NamePhysical Sciences: Tools and Techniques

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/1221/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Grogger, W., Gspan, C., Fladischer, S., Kothleitner, G., & Hofer, F. (2012). Towards single atom sensitivity in the analytical TEM. In European Microscopy Congress (Vol. Volume:2, pp. 685-686). (Physical Sciences: Tools and Techniques). ..