Towards Fully Interoperable NFC Devices

Martin Erb, Christian Steger, Martin Troyer, Josef Preishuber-Pfluegl

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


The steep market ramp-up of the NFC technology in recent years necessitates increasing attention to interoperability issues. During the certification process for NFC-enabled devices, interoperability testing is not yet mandatory but highly recommended. Contrary to existing works, where interoperability test reports show only binary test results, our solution provides improved and detailed information about the faulty device. The framework presented in this paper allows gathering additional information about the NFC communication, improves the test results, and decreases time-consuming manual debugging sessions in case of any error. Furthermore, this framework should encourage other researchers to investigate interoperability issues and develop analysis methods.
Original languageEnglish
Title of host publication2020 IEEE International Conference on RFID, RFID 2020
PublisherIEEE Xplore
Number of pages8
ISBN (Electronic)9781728155760
Publication statusPublished - 28 Sep 2020
Event2020 IEEE International Conference on RFID: IEEE RFID 2020 - Virtual, Orlando, United States
Duration: 28 Sep 202016 Oct 2020


Conference2020 IEEE International Conference on RFID
Abbreviated titleIEEE RFID 2020
Country/TerritoryUnited States
CityVirtual, Orlando


  • framework
  • interoperability
  • measurement system
  • Near Field Communication
  • test automation
  • test platform

ASJC Scopus subject areas

  • Signal Processing
  • Instrumentation
  • Human-Computer Interaction
  • Computer Networks and Communications


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