TOF SIMS analysis of high Tc supercunducting films

Manfred Leisch, Wolfgang Athenstaedt, Ibrahim Kulac

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication12th International Vacuum Congress Book of Abstracts
Place of PublicationAmsterdam
PublisherElsevier B.V.
Pages371-371
Publication statusPublished - 1992
EventInternational Vacuum Congress - Den Haag, Netherlands
Duration: 12 Oct 199216 Oct 1992

Conference

ConferenceInternational Vacuum Congress
CountryNetherlands
CityDen Haag
Period12/10/9216/10/92

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Leisch, M., Athenstaedt, W., & Kulac, I. (1992). TOF SIMS analysis of high Tc supercunducting films. In 12th International Vacuum Congress Book of Abstracts (pp. 371-371). Amsterdam: Elsevier B.V..