Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

Plinio Innocenzi*, Luca Malfatti, Tongjit Kidchob, Stefano Costacurta, Paolo Falcaro, Massimo Piccinini, Augusto Marcelli, Pierangelo Morini, Diego Sali, Heinz Amenitsch

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.

Original languageEnglish
Pages (from-to)5345-5350
Number of pages6
JournalThe Journal of Physical Chemistry / C
Volume111
Issue number14
DOIs
Publication statusPublished - 12 Apr 2007
Externally publishedYes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Energy(all)
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films

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