Time domain FEM computational approach for calibration of surface scan method

Susanne Bauer, Oszkar Biro, Gergely Koczka, Andreas Gleinser, Gunter Winkler, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.

LanguageEnglish
Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
PublisherInstitute of Electrical and Electronics Engineers
Pages866-871
Number of pages6
ISBN (Electronic)9781509059973
DOIs
StatusPublished - 22 Jun 2018
Event60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
Duration: 14 May 201818 May 2018

Conference

Conference60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
CountrySingapore
CitySuntec City
Period14/05/1818/05/18

Fingerprint

near fields
Calibration
Finite element method
probes
immunity
printed circuits
circuit boards
Printed circuit boards
integrated circuits
Integrated circuits
frequency ranges
Electric fields
methodology
Magnetic fields
electromagnetism
magnetic permeability
Radiation
electric fields
radiation
Processing

Keywords

  • Electromagnetic compatibility
  • Electromagnetic modeling
  • Near-field scan
  • TD-FEM

ASJC Scopus subject areas

  • Aerospace Engineering
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fields of Expertise

  • Information, Communication & Computing

Cite this

Bauer, S., Biro, O., Koczka, G., Gleinser, A., Winkler, G., & Deutschmann, B. (2018). Time domain FEM computational approach for calibration of surface scan method. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (pp. 866-871). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2018.8393905

Time domain FEM computational approach for calibration of surface scan method. / Bauer, Susanne; Biro, Oszkar; Koczka, Gergely; Gleinser, Andreas; Winkler, Gunter; Deutschmann, Bernd.

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers, 2018. p. 866-871.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bauer, S, Biro, O, Koczka, G, Gleinser, A, Winkler, G & Deutschmann, B 2018, Time domain FEM computational approach for calibration of surface scan method. in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers, pp. 866-871, 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018, Suntec City, Singapore, 14/05/18. https://doi.org/10.1109/ISEMC.2018.8393905
Bauer S, Biro O, Koczka G, Gleinser A, Winkler G, Deutschmann B. Time domain FEM computational approach for calibration of surface scan method. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers. 2018. p. 866-871 https://doi.org/10.1109/ISEMC.2018.8393905
Bauer, Susanne ; Biro, Oszkar ; Koczka, Gergely ; Gleinser, Andreas ; Winkler, Gunter ; Deutschmann, Bernd. / Time domain FEM computational approach for calibration of surface scan method. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers, 2018. pp. 866-871
@inproceedings{e15fda865db847cf9c165d75c96a0267,
title = "Time domain FEM computational approach for calibration of surface scan method",
abstract = "The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.",
keywords = "Electromagnetic compatibility, Electromagnetic modeling, Near-field scan, TD-FEM",
author = "Susanne Bauer and Oszkar Biro and Gergely Koczka and Andreas Gleinser and Gunter Winkler and Bernd Deutschmann",
year = "2018",
month = "6",
day = "22",
doi = "10.1109/ISEMC.2018.8393905",
language = "English",
pages = "866--871",
booktitle = "2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

TY - GEN

T1 - Time domain FEM computational approach for calibration of surface scan method

AU - Bauer, Susanne

AU - Biro, Oszkar

AU - Koczka, Gergely

AU - Gleinser, Andreas

AU - Winkler, Gunter

AU - Deutschmann, Bernd

PY - 2018/6/22

Y1 - 2018/6/22

N2 - The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.

AB - The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.

KW - Electromagnetic compatibility

KW - Electromagnetic modeling

KW - Near-field scan

KW - TD-FEM

UR - http://www.scopus.com/inward/record.url?scp=85050159087&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2018.8393905

DO - 10.1109/ISEMC.2018.8393905

M3 - Conference contribution

SP - 866

EP - 871

BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

PB - Institute of Electrical and Electronics Engineers

ER -