TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE

Research output: Contribution to conferencePosterResearch

Abstract

We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.

Workshop

WorkshopThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Abbreviated titleSERESSA 2017
CountryGermany
CityGarching
Period23/10/1726/10/17
Internet address

Fingerprint

X rays
Bipolar transistors
MOSFET devices
Resistors
Dosimetry
Transistors
Diodes
Capacitors
Oxides
Integrated circuit design
Analog integrated circuits

Keywords

  • Total Ionizing Dose
  • X-ray
  • Integrated circuits

Fields of Expertise

  • Information, Communication & Computing

Cite this

Michalowska-Forsyth, A. M., & Bezhenova, V. (2017). TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.

TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE. / Michalowska-Forsyth, Alicja Malgorzata; Bezhenova, Varvara.

2017. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.

Research output: Contribution to conferencePosterResearch

Michalowska-Forsyth, AM & Bezhenova, V 2017, 'TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE' The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany, 23/10/17 - 26/10/17, .
Michalowska-Forsyth AM, Bezhenova V. TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE. 2017. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.
Michalowska-Forsyth, Alicja Malgorzata ; Bezhenova, Varvara. / TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.
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abstract = "We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.",
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AU - Michalowska-Forsyth,Alicja Malgorzata

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N2 - We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.

AB - We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.

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