TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE

Research output: Contribution to conferencePoster

Abstract

We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.
Original languageEnglish
Publication statusPublished - 2017
EventThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications - Leibniz Rechenzentrum, Garching, Germany
Duration: 23 Oct 201726 Oct 2017
Conference number: 13
https://seressa.in.tum.de/

Workshop

WorkshopThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Abbreviated titleSERESSA 2017
CountryGermany
CityGarching
Period23/10/1726/10/17
Internet address

Keywords

  • Total Ionizing Dose
  • X-ray
  • Integrated circuits

Fields of Expertise

  • Information, Communication & Computing

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  • Activities

    • 1 Poster presentation

    TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE

    Varvara Bezhenova (Speaker), Alicja Malgorzata Michalowska-Forsyth (Speaker)
    23 Oct 201726 Oct 2017

    Activity: Talk or presentationPoster presentationScience to science

    Cite this

    Michalowska-Forsyth, A. M., & Bezhenova, V. (2017). TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.