Thermally induced stresses in thin aluminium layers grown on silicon

Ernst Eiper, Roland Resel, C. Eisenmenger-Sittner, M. Hafok, J. Keckes

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)74-76
JournalPowder diffraction
Volume19
Issue number1
DOIs
Publication statusPublished - 2004

Projects

High temperature attachment for 4-circle x-ray diffractometers

Eiper, E., Sonderegger, B., Resel, R., Koini, M. & Tamas, E.

1/01/00 → …

Project: Research area

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