Thermal desorption spectroscopy as a tool to charcterize organic thin film growth

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational workshop:"In-situ characterisation of near-surfce processes"
Publisher.
Pages21-21
Publication statusPublished - 2010

Treatment code (Nähere Zuordnung)

  • Experimental
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Winkler, A. (2010). Thermal desorption spectroscopy as a tool to charcterize organic thin film growth. In International workshop:"In-situ characterisation of near-surfce processes" (pp. 21-21). ..

Thermal desorption spectroscopy as a tool to charcterize organic thin film growth. / Winkler, Adolf.

International workshop:"In-situ characterisation of near-surfce processes". ., 2010. p. 21-21.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Winkler, A 2010, Thermal desorption spectroscopy as a tool to charcterize organic thin film growth. in International workshop:"In-situ characterisation of near-surfce processes". ., pp. 21-21.
Winkler A. Thermal desorption spectroscopy as a tool to charcterize organic thin film growth. In International workshop:"In-situ characterisation of near-surfce processes". . 2010. p. 21-21
Winkler, Adolf. / Thermal desorption spectroscopy as a tool to charcterize organic thin film growth. International workshop:"In-situ characterisation of near-surfce processes". ., 2010. pp. 21-21
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