The use of maximum entropy and Bayesian statistics in ion-beam applications

V. M. Prozesky, J. Padayachee, R. Fischer, W. Von Der Linden, V. Dose, C. G. Ryan

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Abstract

An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
Original languageEnglish
Title of host publicationAIP Conference Proceedings
Place of PublicationDenton, Texas
Pages595-598
Number of pages4
Volume392
DOIs
Publication statusPublished - 1 Feb 1997

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entropy (statistics)
Bayes theorem
ion beams
detectors
blurring
entropy
formalism

Cite this

Prozesky, V. M., Padayachee, J., Fischer, R., Von Der Linden, W., Dose, V., & Ryan, C. G. (1997). The use of maximum entropy and Bayesian statistics in ion-beam applications. In AIP Conference Proceedings (Vol. 392, pp. 595-598). Denton, Texas. https://doi.org/10.1063/1.52523

The use of maximum entropy and Bayesian statistics in ion-beam applications. / Prozesky, V. M.; Padayachee, J.; Fischer, R.; Von Der Linden, W.; Dose, V.; Ryan, C. G.

AIP Conference Proceedings. Vol. 392 Denton, Texas, 1997. p. 595-598.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Prozesky, VM, Padayachee, J, Fischer, R, Von Der Linden, W, Dose, V & Ryan, CG 1997, The use of maximum entropy and Bayesian statistics in ion-beam applications. in AIP Conference Proceedings. vol. 392, Denton, Texas, pp. 595-598. https://doi.org/10.1063/1.52523
Prozesky VM, Padayachee J, Fischer R, Von Der Linden W, Dose V, Ryan CG. The use of maximum entropy and Bayesian statistics in ion-beam applications. In AIP Conference Proceedings. Vol. 392. Denton, Texas. 1997. p. 595-598 https://doi.org/10.1063/1.52523
Prozesky, V. M. ; Padayachee, J. ; Fischer, R. ; Von Der Linden, W. ; Dose, V. ; Ryan, C. G. / The use of maximum entropy and Bayesian statistics in ion-beam applications. AIP Conference Proceedings. Vol. 392 Denton, Texas, 1997. pp. 595-598
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