The use of maximum entropy and Bayesian statistics in ion-beam applications

V. M. Prozesky, J. Padayachee, R. Fischer, W. Von Der Linden, V. Dose, C. G. Ryan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
Original languageEnglish
Title of host publicationAIP Conference Proceedings
Place of PublicationDenton, Texas
Pages595-598
Number of pages4
Volume392
DOIs
Publication statusPublished - 1 Feb 1997

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