An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
|Title of host publication||AIP Conference Proceedings|
|Place of Publication||Denton, Texas|
|Number of pages||4|
|Publication status||Published - 1 Feb 1997|