The Role of Chemical Defects for Charge Injection Barriers at Metal / Organic Semiconductor Interfaces

Hermann Edlbauer, Shashank Shekhar Harivyasi, Egbert Zojer, Oliver Hofmann

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2015
EventGerman Physical Society - Spring Meeting (SKM) - Berlin, Deutschland
Duration: 15 Mar 201520 Mar 2015

Conference

ConferenceGerman Physical Society - Spring Meeting (SKM)
CityBerlin, Deutschland
Period15/03/1520/03/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Theoretical
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Edlbauer, H., Harivyasi, S. S., Zojer, E., & Hofmann, O. (2015). The Role of Chemical Defects for Charge Injection Barriers at Metal / Organic Semiconductor Interfaces. Poster session presented at German Physical Society - Spring Meeting (SKM), Berlin, Deutschland, .