The repeatability of system level ESD test and relevant ESD generator parameters

Jayong Koo; Qing Cai; David Pommerenke; Kai Wang; John Mass; Masayuki Hirata; Andy Martwick

doi:10.1109/ISEMC.2008.4652119

The repeatability of system level ESD test and relevant ESD generator parameters

Jayong Koo, Qing Cai, David Pommerenke, Kai Wang, John Mass, Masayuki Hirata, Andy Martwick

Research output: Contribution to journal › Conference article › peer-review

Abstract

Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.

Original language	English
Article number	4652119
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652119
Publication status	Published - 1 Jan 2008
Externally published	Yes
Event	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008

Keywords

correlations
Electrostatic Discharge
ESD
ESD parameters
failure levels
Round Robin test

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/ISEMC.2008.4652119

Cite this

@article{68d7fff7b55246b584d947ed8f54adf8,

title = "The repeatability of system level ESD test and relevant ESD generator parameters",

abstract = "Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.",

keywords = "correlations, Electrostatic Discharge, ESD, ESD parameters, failure levels, Round Robin test",

author = "Jayong Koo and Qing Cai and David Pommerenke and Kai Wang and John Mass and Masayuki Hirata and Andy Martwick",

year = "2008",

month = jan,

day = "1",

doi = "10.1109/ISEMC.2008.4652119",

language = "English",

volume = "2008-January",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

issn = "1077-4076",

publisher = "Institute of Electrical and Electronics Engineers",

note = "2008 IEEE International Symposium on Electromagnetic Compatibility : EMC 2008 ; Conference date: 18-08-2008 Through 22-08-2008",

}

TY - JOUR

T1 - The repeatability of system level ESD test and relevant ESD generator parameters

AU - Koo, Jayong

AU - Cai, Qing

AU - Pommerenke, David

AU - Wang, Kai

AU - Mass, John

AU - Hirata, Masayuki

AU - Martwick, Andy

PY - 2008/1/1

Y1 - 2008/1/1

N2 - Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.

AB - Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.

KW - correlations

KW - Electrostatic Discharge

KW - ESD

KW - ESD parameters

KW - failure levels

KW - Round Robin test

UR - http://www.scopus.com/inward/record.url?scp=84891504853&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2008.4652119

DO - 10.1109/ISEMC.2008.4652119

M3 - Conference article

AN - SCOPUS:84891504853

SN - 1077-4076

VL - 2008-January

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

M1 - 4652119

T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 18 August 2008 through 22 August 2008

ER -

The repeatability of system level ESD test and relevant ESD generator parameters

Abstract

Keywords

ASJC Scopus subject areas

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