The quest for quantitative figures on atomic resolution inelastic STEM images

Gerald Kothleitner, N.R. Lugg, M.J. Neish, S.D. Findlay, Werner Grogger, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationMicroscopy Conference
Publisher.
Pages528-528
Publication statusPublished - 2015
EventMicroscopy Conference 2015: MC15 - Göttingen, Germany
Duration: 6 Sep 201511 Sep 2015

Conference

ConferenceMicroscopy Conference 2015
Abbreviated titleMC
Country/TerritoryGermany
CityGöttingen
Period6/09/1511/09/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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