The influence of beam defocus on volume growth rates for electron beam induced platinum deposition

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Microscopy Congress
Place of PublicationBerlin
PublisherSpringer
Pages683-684
VolumeVolume1
ISBN (Print)978-3-540-85154-7
DOIs
Publication statusPublished - 2008
EventEuropean Microscopy Congress - Aachen, Germany
Duration: 1 Sep 20085 Sep 2008

Publication series

NameInstrumentation and Methods
PublisherSpringer

Conference

ConferenceEuropean Microscopy Congress
CountryGermany
CityAachen
Period1/09/085/09/08

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

The influence of beam defocus on volume growth rates for electron beam induced platinum deposition. / Plank, Harald; Dienstleder, Martina; Kothleitner, Gerald; Hofer, Ferdinand.

European Microscopy Congress. Vol. Volume1 Berlin : Springer, 2008. p. 683-684 (Instrumentation and Methods).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Plank, H, Dienstleder, M, Kothleitner, G & Hofer, F 2008, The influence of beam defocus on volume growth rates for electron beam induced platinum deposition. in European Microscopy Congress. vol. Volume1, Instrumentation and Methods, Springer, Berlin, pp. 683-684, European Microscopy Congress, Aachen, Germany, 1/09/08. https://doi.org/10.1007/978-3-540-85156-1_342
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title = "The influence of beam defocus on volume growth rates for electron beam induced platinum deposition",
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series = "Instrumentation and Methods",
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T1 - The influence of beam defocus on volume growth rates for electron beam induced platinum deposition

AU - Plank, Harald

AU - Dienstleder, Martina

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

PY - 2008

Y1 - 2008

U2 - 10.1007/978-3-540-85156-1_342

DO - 10.1007/978-3-540-85156-1_342

M3 - Conference contribution

SN - 978-3-540-85154-7

VL - Volume1

T3 - Instrumentation and Methods

SP - 683

EP - 684

BT - European Microscopy Congress

PB - Springer

CY - Berlin

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