The Development of an EM-Field Probing System for Manual Near-Field Scanning

Hui He, Pratik Maheshwari, David J. Pommerenke

Research output: Contribution to journalArticle

Abstract

This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were achieved by combining magnetic field probing with a system that automatically records the probe's position and orientation. The local magnetic field associated with the probe location was recorded and displayed at near real time on the captured 3-D geometry. Consequently, a field strength map was obtained for EMC applications. Also, a video showing the spreading of the ESD-induced current with subnanosecond resolution was captured for ESD applications after the ESD-induced surface current density associated with the probe location was recorded.

Original languageEnglish
Article number7419227
Pages (from-to)356-363
Number of pages8
JournalIEEE Transactions on Electromagnetic Compatibility
Volume58
Issue number2
DOIs
Publication statusPublished - 1 Apr 2016
Externally publishedYes

Keywords

  • Electromagnetic compatibility (EMC)
  • electromagnetic interference (EMI) scan
  • electrostatic discharge (ESD)
  • manual scan
  • near-field scan

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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