Abstract
This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were achieved by combining magnetic field probing with a system that automatically records the probe's position and orientation. The local magnetic field associated with the probe location was recorded and displayed at near real time on the captured 3-D geometry. Consequently, a field strength map was obtained for EMC applications. Also, a video showing the spreading of the ESD-induced current with subnanosecond resolution was captured for ESD applications after the ESD-induced surface current density associated with the probe location was recorded.
Original language | English |
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Article number | 7419227 |
Pages (from-to) | 356-363 |
Number of pages | 8 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Volume | 58 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1 Apr 2016 |
Externally published | Yes |
Keywords
- Electromagnetic compatibility (EMC)
- electromagnetic interference (EMI) scan
- electrostatic discharge (ESD)
- manual scan
- near-field scan
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering