The Commuting V-Diagram: on the Relation of Refinement and Testing

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium
EditorsMatthias Baaz, Johann A. Makowsky
PublisherSpringer
Pages15-28
Volume2803
ISBN (Print)978-3-540-40801-7
DOIs
Publication statusPublished - 2003
EventInternational Workshop on Computer Science Logic - Wien, Austria
Duration: 25 Aug 200330 Aug 2003

Publication series

NameLecture notes in computer science
PublisherSpringer

Conference

ConferenceInternational Workshop on Computer Science Logic
CountryAustria
CityWien
Period25/08/0330/08/03

Cite this

Aichernig, B. (2003). The Commuting V-Diagram: on the Relation of Refinement and Testing. In M. Baaz, & J. A. Makowsky (Eds.), Proceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium (Vol. 2803, pp. 15-28). (Lecture notes in computer science). Springer. https://doi.org/10.1007/b13224

The Commuting V-Diagram: on the Relation of Refinement and Testing. / Aichernig, Bernhard.

Proceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium. ed. / Matthias Baaz; Johann A. Makowsky. Vol. 2803 Springer, 2003. p. 15-28 (Lecture notes in computer science).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Aichernig, B 2003, The Commuting V-Diagram: on the Relation of Refinement and Testing. in M Baaz & JA Makowsky (eds), Proceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium. vol. 2803, Lecture notes in computer science, Springer, pp. 15-28, International Workshop on Computer Science Logic, Wien, Austria, 25/08/03. https://doi.org/10.1007/b13224
Aichernig B. The Commuting V-Diagram: on the Relation of Refinement and Testing. In Baaz M, Makowsky JA, editors, Proceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium. Vol. 2803. Springer. 2003. p. 15-28. (Lecture notes in computer science). https://doi.org/10.1007/b13224
Aichernig, Bernhard. / The Commuting V-Diagram: on the Relation of Refinement and Testing. Proceedings of CSL/KGC 2003, the Annual Conference of the European Association for Computer Science Logic and 8th Kurt Gödel Colloquium. editor / Matthias Baaz ; Johann A. Makowsky. Vol. 2803 Springer, 2003. pp. 15-28 (Lecture notes in computer science).
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