The combination of Raman microscopy and electron microscopy – Practical considerations of the influence of vacuum on Raman microscopy

Harald Matthias Fitzek*, Karin Wewerka, Ute Schmidt, Hartmuth Schröttner, Armin Zankel

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Due to the specific vacuum requirements for scanning electron microscopy (SEM), the Raman microscope has tooperate in vacuum in a correlative Raman-SEM, which is a type of microscope combination that has recentlyincreased in popularity. This works considers the implications of conducting Raman microscopy under vacuum,as opposed to operating in ambient air, the standard working regime of this technique. We show that the performanceof the optics of the Raman microscope are identical in both conditions, but laser beam-sample interactions,such as fluorescent bleaching and beam damage, might be different due to the lack of oxygen invacuum. The bleaching of the fluorescent background appears to be mostly unaffected by the lack of oxygen,except when very low laser powers are used. Regarding laser-beam damage, organic samples are more sensitivein vacuum than in air, whereas no definite verdict is possible for inorganic samples. These findings have practicalimplications for the application of correlative Raman-SEM, as low laser powers, or in extreme cases cryomethods,need to be used for organic samples that appear only moderately beam sensitive under usualambient air.
Original languageEnglish
Article number103029
Number of pages6
JournalMicron
Volume143
DOIs
Publication statusPublished - Apr 2021

Keywords

  • Beam damage
  • Correlative microscopy
  • Raman microscopy
  • SEM

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy(all)
  • Structural Biology
  • Cell Biology

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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