The Combination of Electron Microscopy, RamanMicroscopy and Energy Dispersive X-Ray Spectroscopyfor the Investigation of Polymeric Materials

Polymers play an important role in materials science, because of their
advantages over other types of materials. The huge variety in terms of the
types, arrangements and combinations of monomers found in polymers leads
to an extremely wide diversity of different polymeric materials. Although there
is a wide range of analytical techniques to characterize polymeric materials,
here the focus is laid on a novel correlative microscopy method, combining
Raman microscopy, scanning electron microscopy (SEM) and energy dispersive
X-ray spectroscopy (EDXS). Therefore, three polymeric specimens were
analysed by the new system RISE (Raman Imaging and Scanning Electron
microscopy) in combination with EDXS. The aim of this contribution is to
demonstrate the potential of the new system to characterize different
polymeric layers, as well as fillers and additives in polymeric materials. In
addition to the results, a methodical chapter deals with preparation aspects,
investigation skills and imaging modes of the electron microscope. Here the
so-called variable pressure mode (VP) is mentioned, where nitrogen is used
as imaging gas at pressures between 10 and 133 Pa. Furthermore, the lowvoltage
mode in the high vacuum is discussed which gives a better surface
resolution due to a smaller interaction volume of the electrons in the material
and furthermore causes lower beam damage. Both modes work without a
conductive coating on the specimen, which is a requirement for Raman
investigations. Further capabilities of the RISE system in combination with
the EDXS will be discussed afterwards.