Test purpose generation in an industrial application

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 3rd international workshop on Advances in model-based testing
Place of PublicationNew York, NY, USA
PublisherAssociation of Computing Machinery
Pages115-125
ISBN (Print)978-1-59593-850-3
Publication statusPublished - 2007
EventAdvances in Model Based Testing (A-MOST 2007) - London, United Kingdom
Duration: 9 Jul 200712 Jul 2007

Conference

ConferenceAdvances in Model Based Testing (A-MOST 2007)
CountryUnited Kingdom
CityLondon
Period9/07/0712/07/07

Cite this

Aichernig, B., Peischl, B., Weiglhofer, M., & Wotawa, F. (2007). Test purpose generation in an industrial application. In Proceedings of the 3rd international workshop on Advances in model-based testing (pp. 115-125). New York, NY, USA: Association of Computing Machinery.

Test purpose generation in an industrial application. / Aichernig, Bernhard; Peischl, Bernhard; Weiglhofer, Martin; Wotawa, Franz.

Proceedings of the 3rd international workshop on Advances in model-based testing. New York, NY, USA : Association of Computing Machinery, 2007. p. 115-125.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Aichernig, B, Peischl, B, Weiglhofer, M & Wotawa, F 2007, Test purpose generation in an industrial application. in Proceedings of the 3rd international workshop on Advances in model-based testing. Association of Computing Machinery, New York, NY, USA, pp. 115-125, Advances in Model Based Testing (A-MOST 2007), London, United Kingdom, 9/07/07.
Aichernig B, Peischl B, Weiglhofer M, Wotawa F. Test purpose generation in an industrial application. In Proceedings of the 3rd international workshop on Advances in model-based testing. New York, NY, USA: Association of Computing Machinery. 2007. p. 115-125
Aichernig, Bernhard ; Peischl, Bernhard ; Weiglhofer, Martin ; Wotawa, Franz. / Test purpose generation in an industrial application. Proceedings of the 3rd international workshop on Advances in model-based testing. New York, NY, USA : Association of Computing Machinery, 2007. pp. 115-125
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