Test Apparatus for Side-Channel Resistance Compliance Testing

Michael Hutter, Mario Kirschbaum, Thomas Plos, Jörn-Marc Schmidt

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationNon-Invasive Attack Testing Workshop - NIAT 2011, International Workshop, Nara, Japan, September 26-27, 2011.
Publisher.
Pages1-14
Publication statusPublished - 2011
EventNon-Invasive Attack Testing Workshop - Nara, Japan
Duration: 26 Sep 201127 Sep 2011

Conference

ConferenceNon-Invasive Attack Testing Workshop
Country/TerritoryJapan
CityNara
Period26/09/1127/09/11

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental
  • EU - TAMPRES - TAMper Resistant Sensor node

    Hutter, M., Kirschbaum, M., Plos, T., Korak, T., Wenger, E. & Schmidt, J.

    1/10/1030/09/13

    Project: Research project

  • FWF - IIA - Investigation of Implementation Attacks

    Wenger, E., Kirschbaum, M. & Schmidt, J.

    1/03/1030/11/12

    Project: Research project

Cite this