Ternary feature masks: zero-forgetting for task-incremental learning

M. Masana*, T. Tuytelaars, J. Van De Weijer

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

We propose an approach without any forgetting to continual learning for the task-aware regime, where at inference the task-label is known. By using ternary masks we can upgrade a model to new tasks, reusing knowledge from previous tasks while not forgetting anything about them. Using masks prevents both catastrophic forgetting and backward transfer. We argue--and show experimentally--that avoiding the former largely compensates for the lack of the latter, which is rarely observed in practice. In contrast to earlier works, our masks are applied to the features (activations) of each layer instead of the weights. This considerably reduces the number of mask parameters for each new task; with more than three orders of magnitude for most networks. The encoding of the ternary masks into two bits per feature creates very little overhead to the network, avoiding scalability issues. To allow already learned features to adapt to the current task without changing the behavior of these features for previous tasks, we introduce task-specific feature normalization. Extensive experiments on several finegrained datasets and ImageNet show that our method outperforms current state-of-the-art while reducing memory overhead in comparison to weight-based approaches.
Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
Pages3565-3574
Number of pages10
ISBN (Electronic)9781665448994
DOIs
Publication statusPublished - Jun 2021
Externally publishedYes
Event2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops: CVPRW 2021 - Virtuell, United States
Duration: 19 Jun 202125 Jun 2021

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops
Abbreviated titleCVPRW 2021
Country/TerritoryUnited States
CityVirtuell
Period19/06/2125/06/21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Vision and Pattern Recognition

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