Temporally resolved phase stepped speckle interferometry of instationary plasma devices

Martin Hipp, Walter Fliesser, Theo Neger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of SPIE
Publisher.
Pages366-366
Volume3745
Publication statusPublished - 1999

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Hipp, M., Fliesser, W., & Neger, T. (1999). Temporally resolved phase stepped speckle interferometry of instationary plasma devices. In Proceedings of SPIE (Vol. 3745, pp. 366-366). ..

Temporally resolved phase stepped speckle interferometry of instationary plasma devices. / Hipp, Martin; Fliesser, Walter; Neger, Theo.

Proceedings of SPIE. Vol. 3745 ., 1999. p. 366-366.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Hipp, M, Fliesser, W & Neger, T 1999, Temporally resolved phase stepped speckle interferometry of instationary plasma devices. in Proceedings of SPIE. vol. 3745, ., pp. 366-366.
Hipp M, Fliesser W, Neger T. Temporally resolved phase stepped speckle interferometry of instationary plasma devices. In Proceedings of SPIE. Vol. 3745. . 1999. p. 366-366
Hipp, Martin ; Fliesser, Walter ; Neger, Theo. / Temporally resolved phase stepped speckle interferometry of instationary plasma devices. Proceedings of SPIE. Vol. 3745 ., 1999. pp. 366-366
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