Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

Maximilian Hofer, Christoph Böhm, Wolfgang Pribyl

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageGerman
Title of host publicationISIC2011
PublisherInstitute of Electrical and Electronics Engineers
Publication statusAccepted/In press - 2011
EventInternational Symposium on Integrated Circuits, ISIC - Singapur, Singapore
Duration: 12 Dec 201115 Dec 2011

Conference

ConferenceInternational Symposium on Integrated Circuits, ISIC
CountrySingapore
CitySingapur
Period12/12/1115/12/11

Fields of Expertise

  • Information, Communication & Computing

Cite this

Hofer, M., Böhm, C., & Pribyl, W. (Accepted/In press). Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. In ISIC2011 Institute of Electrical and Electronics Engineers.