Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

Maximilian Hofer, Christoph Böhm, Wolfgang Pribyl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Conference

ConferenceInternational Symposium on Integrated Circuits, ISIC
CountrySingapore
CitySingapur
Period12/12/1115/12/11

Fields of Expertise

  • Information, Communication & Computing

Cite this

Hofer, M., Böhm, C., & Pribyl, W. (Accepted/In press). Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. In ISIC2011 Institute of Electrical and Electronics Engineers.

Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. / Hofer, Maximilian; Böhm, Christoph; Pribyl, Wolfgang.

ISIC2011. Institute of Electrical and Electronics Engineers, 2011.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Hofer, M, Böhm, C & Pribyl, W 2011, Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. in ISIC2011. Institute of Electrical and Electronics Engineers, International Symposium on Integrated Circuits, ISIC, Singapur, Singapore, 12/12/11.
Hofer M, Böhm C, Pribyl W. Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. In ISIC2011. Institute of Electrical and Electronics Engineers. 2011.
Hofer, Maximilian ; Böhm, Christoph ; Pribyl, Wolfgang. / Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits. ISIC2011. Institute of Electrical and Electronics Engineers, 2011.
@inproceedings{ea70b7006dcb4a3b93a5bbfb2135a0ff,
title = "Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits",
author = "Maximilian Hofer and Christoph B{\"o}hm and Wolfgang Pribyl",
year = "2011",
language = "deutsch",
booktitle = "ISIC2011",
publisher = "Institute of Electrical and Electronics Engineers",
address = "USA / Vereinigte Staaten",

}

TY - GEN

T1 - Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

AU - Hofer,Maximilian

AU - Böhm,Christoph

AU - Pribyl,Wolfgang

PY - 2011

Y1 - 2011

M3 - Beitrag in einem Konferenzband

BT - ISIC2011

PB - Institute of Electrical and Electronics Engineers

ER -