TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices

Bernhard Schaffer; Alexander Pogantsch; Stephan Rentenberger; Egbert Zojer; Ferdinand Hofer; Christoph Mitterbauer; A. Schertel

doi:10.1017/s1431927603023249

TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices

Bernhard Schaffer, Alexander Pogantsch, Stephan Rentenberger, Egbert Zojer, Ferdinand Hofer, Christoph Mitterbauer, A. Schertel

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	266-267
Journal	Microscopy and Microanalysis
Volume	9(Suppl.3)
DOIs	https://doi.org/10.1017/s1431927603023249
Publication status	Published - 2003

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

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10.1017/s1431927603023249

Analytical Electron Microscopy
Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.
1/01/95 → 31/01/03
Project: Research area

Cite this

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title = "TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices",

author = "Bernhard Schaffer and Alexander Pogantsch and Stephan Rentenberger and Egbert Zojer and Ferdinand Hofer and Christoph Mitterbauer and A. Schertel",

year = "2003",

doi = "10.1017/s1431927603023249",

language = "English",

volume = "9(Suppl.3)",

pages = "266--267",

journal = "Microscopy and Microanalysis",

issn = "1435-8115",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices

AU - Schaffer, Bernhard

AU - Pogantsch, Alexander

AU - Rentenberger, Stephan

AU - Zojer, Egbert

AU - Hofer, Ferdinand

AU - Mitterbauer, Christoph

AU - Schertel, A.

PY - 2003

Y1 - 2003

U2 - 10.1017/s1431927603023249

DO - 10.1017/s1431927603023249

M3 - Article

SN - 1435-8115

VL - 9(Suppl.3)

SP - 266

EP - 267

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Analytical Electron Microscopy

Cite this