TEM Characterization of Optoelectronic Devices Based on Conjugated Polymers: Can FIB Specimen Preparation Help?

Elena Tchernychova, Werner Grogger, Meltem Sezen, Peter Pölt, Evelin Fisslthaler, Emil List, Ferdinand Hofer

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 3 Sep 2006
EventThe 16th International Microscopy Congress - Sapporo, Japan
Duration: 3 Sep 20068 Sep 2006

Conference

ConferenceThe 16th International Microscopy Congress
CountryJapan
CitySapporo
Period3/09/068/09/06

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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