TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationVLSI in the nanometer era
Place of PublicationNew York, NY
PublisherAssociation of Computing Machinery
Pages76-79
ISBN (Print)1-58113-677-3
DOIs
Publication statusPublished - 2003
EventACM Great Lakes Symposium on VLSI - Washington, D.C., United States
Duration: 28 Apr 200329 Apr 2003

Conference

ConferenceACM Great Lakes Symposium on VLSI
CountryUnited States
CityWashington, D.C.
Period28/04/0329/04/03

Fields of Expertise

  • Sonstiges

Cite this

Ostermann, T., & Deutschmann, B. (2003). TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits. In VLSI in the nanometer era (pp. 76-79). New York, NY: Association of Computing Machinery. https://doi.org/10.1145/764808.764829

TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits. / Ostermann, Timm; Deutschmann, Bernd.

VLSI in the nanometer era. New York, NY : Association of Computing Machinery, 2003. p. 76-79.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Ostermann, T & Deutschmann, B 2003, TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits. in VLSI in the nanometer era. Association of Computing Machinery, New York, NY, pp. 76-79, ACM Great Lakes Symposium on VLSI, Washington, D.C., United States, 28/04/03. https://doi.org/10.1145/764808.764829
Ostermann T, Deutschmann B. TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits. In VLSI in the nanometer era. New York, NY: Association of Computing Machinery. 2003. p. 76-79 https://doi.org/10.1145/764808.764829
Ostermann, Timm ; Deutschmann, Bernd. / TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits. VLSI in the nanometer era. New York, NY : Association of Computing Machinery, 2003. pp. 76-79
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