TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	VLSI in the nanometer era
Place of Publication	New York, NY
Publisher	Association of Computing Machinery
Pages	76-79
ISBN (Print)	1-58113-677-3
DOIs	https://doi.org/10.1145/764808.764829
Publication status	Published - 2003
Event	ACM Great Lakes Symposium on VLSI - Washington, D.C., United States Duration: 28 Apr 2003 → 29 Apr 2003

Conference	ACM Great Lakes Symposium on VLSI
Country	United States
City	Washington, D.C.
Period	28/04/03 → 29/04/03

Fields of Expertise

@inproceedings{07f5c8f2920946cf843d482cb36fecb8,

title = "TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits",

author = "Timm Ostermann and Bernd Deutschmann",

year = "2003",

doi = "10.1145/764808.764829",

language = "English",

isbn = "1-58113-677-3",

pages = "76--79",

booktitle = "VLSI in the nanometer era",

publisher = "Association of Computing Machinery",

address = "United States",

}

TY - GEN

T1 - TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

AU - Ostermann, Timm

AU - Deutschmann, Bernd

PY - 2003

Y1 - 2003

U2 - 10.1145/764808.764829

DO - 10.1145/764808.764829

M3 - Conference contribution

SN - 1-58113-677-3

SP - 76

EP - 79

BT - VLSI in the nanometer era

PB - Association of Computing Machinery

CY - New York, NY

ER -