TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationVLSI in the nanometer era
Place of PublicationNew York, NY
PublisherAssociation of Computing Machinery
Pages76-79
ISBN (Print)1-58113-677-3
DOIs
Publication statusPublished - 2003
EventACM Great Lakes Symposium on VLSI - Washington, D.C., United States
Duration: 28 Apr 200329 Apr 2003

Conference

ConferenceACM Great Lakes Symposium on VLSI
CountryUnited States
CityWashington, D.C.
Period28/04/0329/04/03

Fields of Expertise

  • Sonstiges

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