TDS,XPS and LEED: Tools to characterise thin organic films

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationCluster workshop
Publisher.
Pages15-15
Publication statusPublished - 2003
EventCluster Workshop - Graz, Austria
Duration: 9 Dec 200310 Dec 2003

Conference

ConferenceCluster Workshop
CountryAustria
CityGraz
Period9/12/0310/12/03

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Winkler, A. (2003). TDS,XPS and LEED: Tools to characterise thin organic films. In Cluster workshop (pp. 15-15). ..

TDS,XPS and LEED: Tools to characterise thin organic films. / Winkler, Adolf.

Cluster workshop. ., 2003. p. 15-15.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Winkler, A 2003, TDS,XPS and LEED: Tools to characterise thin organic films. in Cluster workshop. ., pp. 15-15, Cluster Workshop, Graz, Austria, 9/12/03.
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