Systematic analysis of ESD-induced soft-failures as a function of operating conditions

Omid Hoseini Izadi, Ahmad Hosseinbeig, David Pommerenke, Hideki Shumiya, Junji Maeshima, Kenji Araki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electrostatic discharges (ESD) to parts of a system can lead to system-level soft-failures. These failures can depend on the activity of the system at the moment of discharge. This paper investigates ESD susceptibility as a function of different operating conditions such as software loading, clock frequency, and VDD voltage. Due to the large number of possible conditions, a commercial automated ESD scanner is modified and used to obtain ESD susceptibility maps for each operating condition. The core processor of a single-board computer is selected as the device under test. It is observed that the processor becomes more sensitive to ESD events as its software loading increases. The effect of VDD voltage and clock frequency on the sensitivity of the processor is also discussed. Moreover, the effect of increasing the power distribution network impedance and noise is investigated, partially leading to counterintuitive results.

Original languageEnglish
Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
PublisherInstitute of Electrical and Electronics Engineers
Pages286-291
Number of pages6
ISBN (Electronic)9781509059973
DOIs
Publication statusPublished - 22 Jun 2018
Externally publishedYes
Event60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
Duration: 14 May 201818 May 2018

Publication series

Name2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

Conference

Conference60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
CountrySingapore
CitySuntec City
Period14/05/1818/05/18

Keywords

  • Electrostatic discharge
  • Soft-failure
  • Susceptibility map
  • Transmission line pulse generator

ASJC Scopus subject areas

  • Aerospace Engineering
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

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  • Cite this

    Izadi, O. H., Hosseinbeig, A., Pommerenke, D., Shumiya, H., Maeshima, J., & Araki, K. (2018). Systematic analysis of ESD-induced soft-failures as a function of operating conditions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (pp. 286-291). (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2018.8393784