Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Giorgi Muchaidze*, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, David Pommerenke

*Corresponding author for this work

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Physics & Astronomy

Engineering & Materials Science