Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Giorgi Muchaidze; Jayong Koo; Qing Cai; Tun Li; Lijun Han; Andrew Martwick; Kai Wang; Jin Min; James L. Drewniak; David Pommerenke

doi:10.1109/TEMC.2008.921059

Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Giorgi Muchaidze^*, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, David Pommerenke

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

Original language	English
Pages (from-to)	268-276
Number of pages	9
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	50
Issue number	2
DOIs	https://doi.org/10.1109/TEMC.2008.921059
Publication status	Published - 1 May 2008
Externally published	Yes

Keywords

Electrostatic discharges (ESDs)
Immunity
Scanning
Susceptibility

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/TEMC.2008.921059

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AU - Muchaidze, Giorgi

AU - Koo, Jayong

AU - Cai, Qing

AU - Li, Tun

AU - Han, Lijun

AU - Martwick, Andrew

AU - Wang, Kai

AU - Min, Jin

AU - Drewniak, James L.

AU - Pommerenke, David

PY - 2008/5/1

Y1 - 2008/5/1

N2 - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

AB - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

KW - Electrostatic discharges (ESDs)

KW - Immunity

KW - Scanning

KW - Susceptibility

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Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems

Abstract

Keywords

ASJC Scopus subject areas

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