Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, J. Min, Lijun Han, David Johannes Pommerenke

Research output: Contribution to conferencePaper

Original languageEnglish
Publication statusPublished - 2007
Externally publishedYes
EventICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, United States
Duration: 27 Jun 200729 Jun 2007

Conference

ConferenceICONIC'2007
CountryUnited States
CitySt. Louis
Period27/06/0729/06/07

Cite this

Muchaidze, G., Koo, J., Li, T., Cai, Q., Min, J., Han, L., & Pommerenke, D. J. (2007). Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems. Paper presented at ICONIC'2007, St. Louis, United States.