Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze; Jayong Koo; T. Li; Q. Cai; J. Min; Lijun Han; David Johannes Pommerenke

Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, J. Min, Lijun Han, David Johannes Pommerenke

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2007
Externally published	Yes
Event	ICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, United States Duration: 27 Jun 2007 → 29 Jun 2007

Conference

Conference	ICONIC'2007
Country/Territory	United States
City	St. Louis
Period	27/06/07 → 29/06/07

Cite this

@conference{ccffa9d8fa53479f919c8d34332cf6df,

title = "Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems",

author = "Giorgi Muchaidze and Jayong Koo and T. Li and Q. Cai and J. Min and Lijun Han and Pommerenke, {David Johannes}",

year = "2007",

language = "English",

note = "ICONIC'2007 : 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging ; Conference date: 27-06-2007 Through 29-06-2007",

}