Surface reconstruction using photometric ratios of backscatter electron images

Stefan Scherer, Andreas Klaus, Axel Pinz

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationRobust Vision for Industrial Applications
Publisher.
Pages99-108
Publication statusPublished - 1999

Cite this

Scherer, S., Klaus, A., & Pinz, A. (1999). Surface reconstruction using photometric ratios of backscatter electron images. In Robust Vision for Industrial Applications (pp. 99-108). ..

Surface reconstruction using photometric ratios of backscatter electron images. / Scherer, Stefan; Klaus, Andreas; Pinz, Axel.

Robust Vision for Industrial Applications. ., 1999. p. 99-108.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Scherer, S, Klaus, A & Pinz, A 1999, Surface reconstruction using photometric ratios of backscatter electron images. in Robust Vision for Industrial Applications. ., pp. 99-108.
Scherer S, Klaus A, Pinz A. Surface reconstruction using photometric ratios of backscatter electron images. In Robust Vision for Industrial Applications. . 1999. p. 99-108
Scherer, Stefan ; Klaus, Andreas ; Pinz, Axel. / Surface reconstruction using photometric ratios of backscatter electron images. Robust Vision for Industrial Applications. ., 1999. pp. 99-108
@inproceedings{6a325598c94e4c5aaea3f58adc6762ab,
title = "Surface reconstruction using photometric ratios of backscatter electron images",
author = "Stefan Scherer and Andreas Klaus and Axel Pinz",
year = "1999",
language = "English",
pages = "99--108",
booktitle = "Robust Vision for Industrial Applications",
publisher = ".",

}

TY - GEN

T1 - Surface reconstruction using photometric ratios of backscatter electron images

AU - Scherer, Stefan

AU - Klaus, Andreas

AU - Pinz, Axel

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 99

EP - 108

BT - Robust Vision for Industrial Applications

PB - .

ER -