Surface Characterization of Silicon-based Materials

Thomas Bodner, Andreas Behrendt, Frank Wiesbrock, Franz Stelzer

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 12 Jan 2012
EventPCCL: 1st Meeting of the Scientific Advisory Board -
Duration: 12 Jan 2012 → …

Conference

ConferencePCCL: 1st Meeting of the Scientific Advisory Board
Period12/01/12 → …

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Bodner, T., Behrendt, A., Wiesbrock, F., & Stelzer, F. (2012). Surface Characterization of Silicon-based Materials. PCCL: 1st Meeting of the Scientific Advisory Board, .

Surface Characterization of Silicon-based Materials. / Bodner, Thomas; Behrendt, Andreas; Wiesbrock, Frank; Stelzer, Franz.

2012. PCCL: 1st Meeting of the Scientific Advisory Board, .

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Bodner, T, Behrendt, A, Wiesbrock, F & Stelzer, F 2012, 'Surface Characterization of Silicon-based Materials' PCCL: 1st Meeting of the Scientific Advisory Board, 12/01/12, .
Bodner T, Behrendt A, Wiesbrock F, Stelzer F. Surface Characterization of Silicon-based Materials. 2012. PCCL: 1st Meeting of the Scientific Advisory Board, .
Bodner, Thomas ; Behrendt, Andreas ; Wiesbrock, Frank ; Stelzer, Franz. / Surface Characterization of Silicon-based Materials. PCCL: 1st Meeting of the Scientific Advisory Board, .
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language = "English",
note = "PCCL: 1st Meeting of the Scientific Advisory Board ; Conference date: 12-01-2012",

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T1 - Surface Characterization of Silicon-based Materials

AU - Bodner, Thomas

AU - Behrendt, Andreas

AU - Wiesbrock, Frank

AU - Stelzer, Franz

PY - 2012/1/12

Y1 - 2012/1/12

M3 - (Old data) Lecture or Presentation

ER -