Surface Characterization of Semiconductor Materials

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageGerman
Publication statusPublished - 26 Nov 2009
EventChemistry and Technology of Materials -
Duration: 26 Nov 2009 → …

Conference

ConferenceChemistry and Technology of Materials
Period26/11/09 → …

Cite this

Bodner, T., Wiesbrock, F., & Stelzer, F. (2009). Surface Characterization of Semiconductor Materials. Chemistry and Technology of Materials, .

Surface Characterization of Semiconductor Materials. / Bodner, Thomas; Wiesbrock, Frank; Stelzer, Franz.

2009. Chemistry and Technology of Materials, .

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Bodner, T, Wiesbrock, F & Stelzer, F 2009, 'Surface Characterization of Semiconductor Materials' Chemistry and Technology of Materials, 26/11/09, .
Bodner T, Wiesbrock F, Stelzer F. Surface Characterization of Semiconductor Materials. 2009. Chemistry and Technology of Materials, .
Bodner, Thomas ; Wiesbrock, Frank ; Stelzer, Franz. / Surface Characterization of Semiconductor Materials. Chemistry and Technology of Materials, .
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title = "Surface Characterization of Semiconductor Materials",
author = "Thomas Bodner and Frank Wiesbrock and Franz Stelzer",
year = "2009",
month = "11",
day = "26",
language = "deutsch",
note = "null ; Conference date: 26-11-2009",

}

TY - CONF

T1 - Surface Characterization of Semiconductor Materials

AU - Bodner, Thomas

AU - Wiesbrock, Frank

AU - Stelzer, Franz

PY - 2009/11/26

Y1 - 2009/11/26

M3 - (Altdaten) Vortrag oder Präsentation

ER -