Super resolution emission source microscopy using water immersion

Victor Khilkevich, Rajashree Ghorude, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A two-dimensional emission source microscopy (ESM) algorithm based on the synthetic aperture radar (SAR) technique is used for EMI source localization. The resolution of the ESM method is proportional to the wavelength of electromagnetic radiation, and at the frequency of 1 GHz, the theoretical resolution limit in air is 15 cm which is too coarse for many practical applications. The resolution can be improved if water is used as the medium between the device under test (DUT) and the receiving probe, leading to a much shorter wavelength. It is demonstrated that by using water immersion it is possible to achieve resolution of 2.5 cm at 1 GHz, which is a 6-fold improvement over a measurement in air.

Original languageEnglish
Title of host publication2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
PublisherInstitute of Electrical and Electronics Engineers
Pages695-700
Number of pages6
ISBN (Electronic)9781509014415
DOIs
Publication statusPublished - 19 Sep 2016
Externally publishedYes
Event2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 - Ottawa, Canada
Duration: 25 Jul 201629 Jul 2016

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2016-September
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
CountryCanada
CityOttawa
Period25/07/1629/07/16

Keywords

  • EMI
  • Emission Source Microscopy
  • manual scan
  • microwave imaging
  • resolution
  • source localization

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Khilkevich, V., Ghorude, R., & Pommerenke, D. (2016). Super resolution emission source microscopy using water immersion. In 2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 (pp. 695-700). [7571733] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2016-September). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2016.7571733