Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays

Christian Mentin, Robin Priewald, Eugen Brenner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The precise and very fast contactless measurement
of object surfaces and edges with sub-micrometer resolution plays
an important role in many applications nowadays. Optical highprecision
measuring devices are used for that purpose. The use of
narrowband point light sources for exposing an object generates a
diffraction pattern, which can be seen by a sensor. To achieve a
much higher resolution than the pixel size of the detector, that
additional information generated by this diffraction pattern can
be used. Different algorithms for estimating the projected edge
position with sub-pixel resolution using additional diffraction
pattern information were evaluated. With a modelled image
sensor pixel size of 3.8 μm, results showed that a prediction error
for the theoretical projected edge position on the sensor of less
than 200 nm could be achieved. The influence of measurement
noise, pixel size, and ADC resolution of the pixel exposure value
are discussed for the presented algorithms.
LanguageGerman
Title of host publicationProceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications
Number of pages6
StatusPublished - 14 Sep 2016
EventInternational Conference on Broadband Communications for Next Generation Networks and Multimedia Applications - Graz, Austria
Duration: 14 Sep 201616 Sep 2016
https://www.cobcom.tugraz.at/

Conference

ConferenceInternational Conference on Broadband Communications for Next Generation Networks and Multimedia Applications
Abbreviated titleCoBCom
CountryAustria
CityGraz
Period14/09/1616/09/16
Internet address

Keywords

  • High-resolution imaging
  • Optical diffraction
  • Algorithm design and analysis
  • Image edge detection
  • Image sensors

Cite this

Mentin, C., Priewald, R., & Brenner, E. (2016). Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays. In Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications

Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays. / Mentin, Christian; Priewald, Robin; Brenner, Eugen.

Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications. 2016.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Mentin, C, Priewald, R & Brenner, E 2016, Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays. in Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications. International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications, Graz, Austria, 14/09/16.
Mentin C, Priewald R, Brenner E. Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays. In Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications. 2016.
Mentin, Christian ; Priewald, Robin ; Brenner, Eugen. / Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays. Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications. 2016.
@inproceedings{e7e16d94133e44f5b5360016d79a40c9,
title = "Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays",
abstract = "The precise and very fast contactless measurementof object surfaces and edges with sub-micrometer resolution playsan important role in many applications nowadays. Optical highprecisionmeasuring devices are used for that purpose. The use ofnarrowband point light sources for exposing an object generates adiffraction pattern, which can be seen by a sensor. To achieve amuch higher resolution than the pixel size of the detector, thatadditional information generated by this diffraction pattern canbe used. Different algorithms for estimating the projected edgeposition with sub-pixel resolution using additional diffractionpattern information were evaluated. With a modelled imagesensor pixel size of 3.8 μm, results showed that a prediction errorfor the theoretical projected edge position on the sensor of lessthan 200 nm could be achieved. The influence of measurementnoise, pixel size, and ADC resolution of the pixel exposure valueare discussed for the presented algorithms.",
keywords = "High-resolution imaging, Optical diffraction, Algorithm design and analysis, Image edge detection, Image sensors",
author = "Christian Mentin and Robin Priewald and Eugen Brenner",
year = "2016",
month = "9",
day = "14",
language = "deutsch",
booktitle = "Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications",

}

TY - GEN

T1 - Subpixel Resolution Edge Detection Techniques for Linear Sensor Arrays

AU - Mentin,Christian

AU - Priewald,Robin

AU - Brenner,Eugen

PY - 2016/9/14

Y1 - 2016/9/14

N2 - The precise and very fast contactless measurementof object surfaces and edges with sub-micrometer resolution playsan important role in many applications nowadays. Optical highprecisionmeasuring devices are used for that purpose. The use ofnarrowband point light sources for exposing an object generates adiffraction pattern, which can be seen by a sensor. To achieve amuch higher resolution than the pixel size of the detector, thatadditional information generated by this diffraction pattern canbe used. Different algorithms for estimating the projected edgeposition with sub-pixel resolution using additional diffractionpattern information were evaluated. With a modelled imagesensor pixel size of 3.8 μm, results showed that a prediction errorfor the theoretical projected edge position on the sensor of lessthan 200 nm could be achieved. The influence of measurementnoise, pixel size, and ADC resolution of the pixel exposure valueare discussed for the presented algorithms.

AB - The precise and very fast contactless measurementof object surfaces and edges with sub-micrometer resolution playsan important role in many applications nowadays. Optical highprecisionmeasuring devices are used for that purpose. The use ofnarrowband point light sources for exposing an object generates adiffraction pattern, which can be seen by a sensor. To achieve amuch higher resolution than the pixel size of the detector, thatadditional information generated by this diffraction pattern canbe used. Different algorithms for estimating the projected edgeposition with sub-pixel resolution using additional diffractionpattern information were evaluated. With a modelled imagesensor pixel size of 3.8 μm, results showed that a prediction errorfor the theoretical projected edge position on the sensor of lessthan 200 nm could be achieved. The influence of measurementnoise, pixel size, and ADC resolution of the pixel exposure valueare discussed for the presented algorithms.

KW - High-resolution imaging

KW - Optical diffraction

KW - Algorithm design and analysis

KW - Image edge detection

KW - Image sensors

M3 - Beitrag in einem Konferenzband

BT - Proceedings of the 2016 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications

ER -