Sub-micrometer synchrotron tomography of multiphase metals using Kirkpatrick-Baez optics

Guillermo Requena, Peter Cloetens, W. Altendorfer, Maria Cecilia Poletti, Domonkos Tolnai, Fernando Warchomicka, Hans Peter Degischer

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)760-763
JournalScripta Materialia
Volume61
Issue number7
DOIs
Publication statusPublished - 2009

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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