Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Heinz-Georg Flesch, Armin Moser, Jiri Novak, Detlef M. Smilgies, Elke Kraker, Bernhard Lamprecht, Anja Haase, Werner Grogger, Roland Resel

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1-7
JournalJournal of Applied Physics
Volume110
Issue number114911
DOIs
Publication statusPublished - 2011

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. / Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan; Flesch, Heinz-Georg; Moser, Armin; Novak, Jiri; Smilgies, Detlef M.; Kraker, Elke; Lamprecht, Bernhard; Haase, Anja; Grogger, Werner; Resel, Roland.

In: Journal of Applied Physics, Vol. 110, No. 114911, 2011, p. 1-7.

Research output: Contribution to journalArticleResearchpeer-review

Neuhold, A, Fladischer, S, Mitsche, S, Flesch, H-G, Moser, A, Novak, J, Smilgies, DM, Kraker, E, Lamprecht, B, Haase, A, Grogger, W & Resel, R 2011, 'Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study' Journal of Applied Physics, vol. 110, no. 114911, pp. 1-7. https://doi.org/10.1063/1.3667171
Neuhold, Alfred ; Fladischer, Stefanie ; Mitsche, Stefan ; Flesch, Heinz-Georg ; Moser, Armin ; Novak, Jiri ; Smilgies, Detlef M. ; Kraker, Elke ; Lamprecht, Bernhard ; Haase, Anja ; Grogger, Werner ; Resel, Roland. / Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. In: Journal of Applied Physics. 2011 ; Vol. 110, No. 114911. pp. 1-7.
@article{b64f9e09aa0e4d8ca82f00aa83795512,
title = "Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study",
author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Heinz-Georg Flesch and Armin Moser and Jiri Novak and Smilgies, {Detlef M.} and Elke Kraker and Bernhard Lamprecht and Anja Haase and Werner Grogger and Roland Resel",
year = "2011",
doi = "10.1063/1.3667171",
language = "English",
volume = "110",
pages = "1--7",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "114911",

}

TY - JOUR

T1 - Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Novak, Jiri

AU - Smilgies, Detlef M.

AU - Kraker, Elke

AU - Lamprecht, Bernhard

AU - Haase, Anja

AU - Grogger, Werner

AU - Resel, Roland

PY - 2011

Y1 - 2011

UR - http://jap.aip.org/resource/1/japiau/v110/i11/p114911_s1

U2 - 10.1063/1.3667171

DO - 10.1063/1.3667171

M3 - Article

VL - 110

SP - 1

EP - 7

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 114911

ER -