Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Heinz-Georg Flesch, Armin Moser, Jiri Novak, Detlef M. Smilgies, Elke Kraker, Bernhard Lamprecht, Anja Haase, Werner Grogger, Roland Resel

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1-7
JournalJournal of Applied Physics
Volume110
Issue number114911
DOIs
Publication statusPublished - 2011

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

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