Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy

Alfred Neuhold, Stefanie Fladischer, Markus Neuschitzer, Ingo Salzmann, Elke Kraker, Bernhard Lamprecht, Werner Grogger, Roland Resel

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2011
EventEuropean Conference on Molecular Electronics 2011 - Barcelona, Spain
Duration: 6 Sep 201110 Sep 2011

Conference

ConferenceEuropean Conference on Molecular Electronics 2011
CityBarcelona, Spain
Period6/09/1110/09/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Neuhold, A., Fladischer, S., Neuschitzer, M., Salzmann, I., Kraker, E., Lamprecht, B., ... Resel, R. (2011). Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy. Poster session presented at European Conference on Molecular Electronics 2011, Barcelona, Spain, .

Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy. / Neuhold, Alfred; Fladischer, Stefanie; Neuschitzer, Markus; Salzmann, Ingo; Kraker, Elke; Lamprecht, Bernhard; Grogger, Werner; Resel, Roland.

2011. Poster session presented at European Conference on Molecular Electronics 2011, Barcelona, Spain, .

Research output: Contribution to conferencePosterResearch

Neuhold, A, Fladischer, S, Neuschitzer, M, Salzmann, I, Kraker, E, Lamprecht, B, Grogger, W & Resel, R 2011, 'Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy' European Conference on Molecular Electronics 2011, Barcelona, Spain, 6/09/11 - 10/09/11, .
Neuhold A, Fladischer S, Neuschitzer M, Salzmann I, Kraker E, Lamprecht B et al. Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy. 2011. Poster session presented at European Conference on Molecular Electronics 2011, Barcelona, Spain, .
Neuhold, Alfred ; Fladischer, Stefanie ; Neuschitzer, Markus ; Salzmann, Ingo ; Kraker, Elke ; Lamprecht, Bernhard ; Grogger, Werner ; Resel, Roland. / Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy. Poster session presented at European Conference on Molecular Electronics 2011, Barcelona, Spain, .
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year = "2011",
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note = "European Conference on Molecular Electronics 2011 ; Conference date: 06-09-2011 Through 10-09-2011",

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T1 - Structural and Morphological Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Neuschitzer, Markus

AU - Salzmann, Ingo

AU - Kraker, Elke

AU - Lamprecht, Bernhard

AU - Grogger, Werner

AU - Resel, Roland

PY - 2011

Y1 - 2011

UR - http://www.ecme2011.com/

M3 - Poster

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