Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Nadezda Matsko, Heinz-Georg Flesch, Armin Moser, Detlef M. Smilgies, Elke Kraker, Werner Grogger, Roland Resel

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2010
Event10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging - Warwick
Duration: 20 Sep 201023 Sep 2010

Conference

Conference10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
CityWarwick
Period20/09/1023/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

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