Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Nadezda Matsko, Heinz-Georg Flesch, Armin Moser, Detlef M. Smilgies, Elke Kraker, Werner Grogger, Roland Resel

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2010
Event10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging - Warwick
Duration: 20 Sep 201023 Sep 2010

Conference

Conference10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
CityWarwick
Period20/09/1023/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Neuhold, A., Fladischer, S., Mitsche, S., Matsko, N., Flesch, H-G., Moser, A., ... Resel, R. (2010). Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, .

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. / Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan; Matsko, Nadezda; Flesch, Heinz-Georg; Moser, Armin; Smilgies, Detlef M.; Kraker, Elke; Grogger, Werner; Resel, Roland.

2010. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, .

Research output: Contribution to conferencePosterResearch

Neuhold, A, Fladischer, S, Mitsche, S, Matsko, N, Flesch, H-G, Moser, A, Smilgies, DM, Kraker, E, Grogger, W & Resel, R 2010, 'Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM' 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, 20/09/10 - 23/09/10, .
Neuhold A, Fladischer S, Mitsche S, Matsko N, Flesch H-G, Moser A et al. Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. 2010. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, .
Neuhold, Alfred ; Fladischer, Stefanie ; Mitsche, Stefan ; Matsko, Nadezda ; Flesch, Heinz-Georg ; Moser, Armin ; Smilgies, Detlef M. ; Kraker, Elke ; Grogger, Werner ; Resel, Roland. / Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, .
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title = "Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM",
author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Nadezda Matsko and Heinz-Georg Flesch and Armin Moser and Smilgies, {Detlef M.} and Elke Kraker and Werner Grogger and Roland Resel",
year = "2010",
language = "English",
note = "10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging ; Conference date: 20-09-2010 Through 23-09-2010",

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TY - CONF

T1 - Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Matsko, Nadezda

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Smilgies, Detlef M.

AU - Kraker, Elke

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

UR - http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010

M3 - Poster

ER -