Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Armin Moser, Heinz-Georg Flesch, Jiri Novak, Elke Kraker, Anja Haase, Detlef M. Smilgies, Werner Grogger, Roland Resel

Research output: Contribution to conferencePosterResearch

Original languageGerman
Publication statusPublished - 2010
EventISOTEC Meeting 2010 - Reinischkogel
Duration: 25 Nov 201026 Nov 2010

Conference

ConferenceISOTEC Meeting 2010
CityReinischkogel
Period25/11/1026/11/10

Cite this

Neuhold, A., Fladischer, S., Mitsche, S., Moser, A., Flesch, H-G., Novak, J., ... Resel, R. (2010). Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. Poster session presented at ISOTEC Meeting 2010, Reinischkogel, .

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. / Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan; Moser, Armin; Flesch, Heinz-Georg; Novak, Jiri; Kraker, Elke; Haase, Anja; Smilgies, Detlef M.; Grogger, Werner; Resel, Roland.

2010. Poster session presented at ISOTEC Meeting 2010, Reinischkogel, .

Research output: Contribution to conferencePosterResearch

Neuhold, A, Fladischer, S, Mitsche, S, Moser, A, Flesch, H-G, Novak, J, Kraker, E, Haase, A, Smilgies, DM, Grogger, W & Resel, R 2010, 'Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM' ISOTEC Meeting 2010, Reinischkogel, 25/11/10 - 26/11/10, .
Neuhold A, Fladischer S, Mitsche S, Moser A, Flesch H-G, Novak J et al. Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. 2010. Poster session presented at ISOTEC Meeting 2010, Reinischkogel, .
Neuhold, Alfred ; Fladischer, Stefanie ; Mitsche, Stefan ; Moser, Armin ; Flesch, Heinz-Georg ; Novak, Jiri ; Kraker, Elke ; Haase, Anja ; Smilgies, Detlef M. ; Grogger, Werner ; Resel, Roland. / Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. Poster session presented at ISOTEC Meeting 2010, Reinischkogel, .
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title = "Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM",
author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Armin Moser and Heinz-Georg Flesch and Jiri Novak and Elke Kraker and Anja Haase and Smilgies, {Detlef M.} and Werner Grogger and Roland Resel",
year = "2010",
language = "deutsch",
note = "null ; Conference date: 25-11-2010 Through 26-11-2010",

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TY - CONF

T1 - Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Moser, Armin

AU - Flesch, Heinz-Georg

AU - Novak, Jiri

AU - Kraker, Elke

AU - Haase, Anja

AU - Smilgies, Detlef M.

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

M3 - Poster

ER -