STEM study of NiSi2/Si interface at inclusion boundaries

Gyorgy Zoltan Radnóczi, Daniel Knez, Ferdinand Hofer, N. Frangis, N. Vouroutzis, J. Stoemenos, B. Pécz

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationMCM2017 conference
Number of pages1
Publication statusPublished - 24 Sep 2017
Event13th Multinational Congress on Microscopy - Rovinj, Croatia
Duration: 24 Sep 201729 Sep 2017

Conference

Conference13th Multinational Congress on Microscopy
Abbreviated titleMCM 2017
CountryCroatia
CityRovinj
Period24/09/1729/09/17

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Radnóczi, G. Z., Knez, D., Hofer, F., Frangis, N., Vouroutzis, N., Stoemenos, J., & Pécz, B. (2017). STEM study of NiSi2/Si interface at inclusion boundaries. In MCM2017 conference

STEM study of NiSi2/Si interface at inclusion boundaries. / Radnóczi, Gyorgy Zoltan; Knez, Daniel; Hofer, Ferdinand; Frangis, N.; Vouroutzis, N.; Stoemenos, J.; Pécz, B.

MCM2017 conference . 2017.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Radnóczi, GZ, Knez, D, Hofer, F, Frangis, N, Vouroutzis, N, Stoemenos, J & Pécz, B 2017, STEM study of NiSi2/Si interface at inclusion boundaries. in MCM2017 conference . 13th Multinational Congress on Microscopy, Rovinj, Croatia, 24/09/17.
Radnóczi GZ, Knez D, Hofer F, Frangis N, Vouroutzis N, Stoemenos J et al. STEM study of NiSi2/Si interface at inclusion boundaries. In MCM2017 conference . 2017
Radnóczi, Gyorgy Zoltan ; Knez, Daniel ; Hofer, Ferdinand ; Frangis, N. ; Vouroutzis, N. ; Stoemenos, J. ; Pécz, B. / STEM study of NiSi2/Si interface at inclusion boundaries. MCM2017 conference . 2017.
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AU - Radnóczi, Gyorgy Zoltan

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AU - Hofer, Ferdinand

AU - Frangis, N.

AU - Vouroutzis, N.

AU - Stoemenos, J.

AU - Pécz, B.

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