STEM study of NiSi2/Si interface at inclusion boundaries

Gyorgy Zoltan Radnóczi, Daniel Knez, Ferdinand Hofer, N. Frangis, N. Vouroutzis, J. Stoemenos, B. Pécz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMCM2017 conference
Number of pages1
Publication statusPublished - 24 Sep 2017
Event13th Multinational Congress on Microscopy - Rovinj, Croatia
Duration: 24 Sep 201729 Sep 2017


Conference13th Multinational Congress on Microscopy
Abbreviated titleMCM 2017

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Radnóczi, G. Z., Knez, D., Hofer, F., Frangis, N., Vouroutzis, N., Stoemenos, J., & Pécz, B. (2017). STEM study of NiSi2/Si interface at inclusion boundaries. In MCM2017 conference