STEM and EFTEM-Analysis of Nanomaterials at High Spatial and Energy Resolution

Werner Grogger, Bernhard Schaffer, Michael Rogers, Gerald Kothleitner, Ferdinand Hofer

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 31 Jul 2005
EventMicroscopy & Microanalysis 2005 - Honolulu, United States
Duration: 31 Jul 20054 Aug 2005

Conference

ConferenceMicroscopy & Microanalysis 2005
CountryUnited States
CityHonolulu
Period31/07/054/08/05

Fields of Expertise

  • Advanced Materials Science

Cite this

Grogger, W., Schaffer, B., Rogers, M., Kothleitner, G., & Hofer, F. (2005). STEM and EFTEM-Analysis of Nanomaterials at High Spatial and Energy Resolution. Microscopy & Microanalysis 2005, Honolulu, United States.