Standards for Analysis of Submicron Particles by SEM/EDXS

Mario Schmied, Peter Pölt, Jonas Dahl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Congress on Electron Microscopy
PublisherCzechoslovak Society for Electron Microscopy
Pages287-288
ISBN (Print)80-2385503-4
Publication statusPublished - 2000
EventEuropean Congress on Electron Microscopy - Brno, Czech Republic
Duration: 9 Jul 200014 Jul 2000

Conference

ConferenceEuropean Congress on Electron Microscopy
CountryCzech Republic
CityBrno
Period9/07/0014/07/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmied, M., Pölt, P., & Dahl, J. (2000). Standards for Analysis of Submicron Particles by SEM/EDXS. In European Congress on Electron Microscopy (pp. 287-288). Czechoslovak Society for Electron Microscopy.