Standards for Analysis of Submicron Particles by SEM/EDXS

Mario Schmied, Peter Pölt

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2000
EventEuropean Congress on Electron Microscopy - Brno, Czech Republic
Duration: 9 Jul 200014 Jul 2000

Conference

ConferenceEuropean Congress on Electron Microscopy
Country/TerritoryCzech Republic
CityBrno
Period9/07/0014/07/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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