Specification-based Verification of Embedded Systems by Automated Test Case Generation

Christoph Kirchsteiger, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the International Workshop on Distributed Embedded Systems: Design, Middleware and Resources (DIPES 2008)
Place of PublicationDeutschland
PublisherKluwer
Pages35-44
Publication statusPublished - 2008
EventIFIP Working Conference on Distributed and Parallel Embedded Systems - Mailand, Italy
Duration: 7 Sep 20089 Sep 2008

Conference

ConferenceIFIP Working Conference on Distributed and Parallel Embedded Systems
CountryItaly
CityMailand
Period7/09/089/09/08

Projects

Hardware/Software-Codesign

Pieber, T. W., Steger, C., Weiß, R., Ulz, T., Schachner, M., Kreiner, C. J., Plank, H., Troyer, M., Gressl, L. A., Seifert, C., Warmer, F., Rech, A., Erb, M., Scherr, F., Kammerer, M., Stelzer, P., Frewein, A., Strasser, A., Lindner, J., Ess, A., Feldbacher, M. & Weissteiner, H.

1/01/95 → …

Project: Research area

Cite this

Kirchsteiger, C., Trummer, C., Steger, C., Weiß, R., & Pistauer, M. (2008). Specification-based Verification of Embedded Systems by Automated Test Case Generation. In Proceedings of the International Workshop on Distributed Embedded Systems: Design, Middleware and Resources (DIPES 2008) (pp. 35-44). Deutschland: Kluwer.