Specification-based Verification of Embedded Systems by Automated Test Case Generation

Christoph Kirchsteiger, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationProceedings of the International Workshop on Distributed Embedded Systems: Design, Middleware and Resources (DIPES 2008)
Place of PublicationDeutschland
PublisherKluwer
Pages35-44
Publication statusPublished - 2008
EventIFIP Working Conference on Distributed and Parallel Embedded Systems - Mailand, Italy
Duration: 7 Sep 20089 Sep 2008

Conference

ConferenceIFIP Working Conference on Distributed and Parallel Embedded Systems
CountryItaly
CityMailand
Period7/09/089/09/08

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