Source isolation measurements in a multi-source coupled system

Abhishek Patnaik, Guangyao Shen, David Pommerenke, Martin Boettcher, Herman Aichele, Christoph Keller, Victor Khilkevich

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

An electronic system will commonly have multiple emission (or noise) sources, some of which are correlated while others are un-correlated. Measuring the contribution to a node voltage or branch current by an individual source with high accuracy in such a multi source inter-coupled system is a fundamental problem. The problem is further amplified when the signal processing following the measurements is highly sensitive to the error in the measured parameters. This article describes a filtering method which can isolate the measured parameter (voltage or current) of the contribution of other such sources while preserving the phase and magnitude associated with the source under consideration.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
Pages75-80
Number of pages6
ISBN (Electronic)9781538622308
DOIs
Publication statusPublished - 20 Oct 2017
Externally publishedYes
Event2017 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity: EMCSI 2017 - Washington, United States
Duration: 7 Aug 201711 Aug 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2017 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity
Country/TerritoryUnited States
CityWashington
Period7/08/1711/08/17

Keywords

  • Adaptive Noise Cancellation
  • Black box model
  • EMI
  • selective source filtering
  • Terminal modelling

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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