Software-based instrumentation for localization of faults caused by electrostatic discharge

Pratik Maheshwari*, Byong Su Seol, Jong Sung Lee, Jae Deok Lim, Sahra Sedigh, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electrostatic discharge (ESD) is often the cause of system-level failure or malfunction of embedded systems. The underlying faults are difficult to localize, as the information gained from the hardware-based diagnostic methods typically in use lacks sufficient detail. The alternative proposed in this paper is software instrumentation that monitors key registers and flags to detect anomalies indicative of failure. In contrast to hardware-based techniques, which use invasive probes that can alter the very phenomena being studied; the proposed approach makes use of standard peripherals such as the serial or Ethernet port to monitor and record the effect of ESD. We illustrate the use of this software instrumentation technique in conjunction with a three-dimensional ESD injection system to produce a sensitivity map that visualizes the susceptibility of various segments of an embedded system to ESD.

Original languageEnglish
Title of host publicationProceedings - 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering, HASE 2011
Pages333-339
Number of pages7
DOIs
Publication statusPublished - 1 Dec 2011
Externally publishedYes
Event13th IEEE International Symposium on High Assurance Systems Engineering, HASE 2011 - Boca Raton, FL, United States
Duration: 10 Nov 201112 Nov 2011

Publication series

NameProceedings of IEEE International Symposium on High Assurance Systems Engineering
ISSN (Print)1530-2059

Conference

Conference13th IEEE International Symposium on High Assurance Systems Engineering, HASE 2011
CountryUnited States
CityBoca Raton, FL
Period10/11/1112/11/11

Keywords

  • Electromagnetic interference
  • Electrostatic discharge
  • Embedded systems
  • Fault localization
  • Software instrumentation

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Maheshwari, P., Seol, B. S., Lee, J. S., Lim, J. D., Sedigh, S., & Pommerenke, D. (2011). Software-based instrumentation for localization of faults caused by electrostatic discharge. In Proceedings - 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering, HASE 2011 (pp. 333-339). [6113916] (Proceedings of IEEE International Symposium on High Assurance Systems Engineering). https://doi.org/10.1109/HASE.2011.64