Software-based analysis of the effects of electrostatic discharge on embedded systems

Pratik Maheshwari*, Tianqi Li, Jong Sung Lee, Byong Su Seol, Sahra Sedigh, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper illustrates the use of software for monitoring and recording the effects of electrostatic discharge (ESD) on the operation of embedded systems, with the goal of facilitating root-cause analysis of resulting failures. Hard-warebased scanning techniques are typically used for analyzing the effect of ESD on systems by identifying physical coupling paths. This paper proposes software techniques that monitor registers and flags associated with peripherals of embedded systems to detect faults associated with the effects of ESD. A lightweight, cost-effective, and non-intrusive software tool has been developed that monitors and records the status of all registers associated with a designated peripheral under test, identifying the fault propagation caused by ESD in the system, and visually presenting the resulting errors. The tool has been used to detect and visually summarize ESD-induced errors on the SD card peripheral of the S3C2440 development board, using local injection and system-level scanning. Root-cause analysis of these faults can potentially assist in identification of coupling paths of electromagnetic interference, as well as determination of areas of the hardware that are more vulnerable to ESD.

Original languageEnglish
Title of host publicationProceedings - 35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011
Pages436-441
Number of pages6
DOIs
Publication statusPublished - 1 Nov 2011
Externally publishedYes
Event35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011 - Munich, Germany
Duration: 18 Jul 201121 Jul 2011

Publication series

NameProceedings - International Computer Software and Applications Conference
ISSN (Print)0730-3157

Conference

Conference35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011
CountryGermany
CityMunich
Period18/07/1121/07/11

Keywords

  • Electromagnetic interference
  • Electrostatic discharge
  • Embedded systems
  • Software instrumentation

ASJC Scopus subject areas

  • Software
  • Computer Science Applications

Fingerprint Dive into the research topics of 'Software-based analysis of the effects of electrostatic discharge on embedded systems'. Together they form a unique fingerprint.

  • Cite this

    Maheshwari, P., Li, T., Lee, J. S., Seol, B. S., Sedigh, S., & Pommerenke, D. (2011). Software-based analysis of the effects of electrostatic discharge on embedded systems. In Proceedings - 35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011 (pp. 436-441). [6032376] (Proceedings - International Computer Software and Applications Conference). https://doi.org/10.1109/COMPSAC.2011.64